Reliability/products qualification test line-up
- High Temperature Storage test (HTSL)
- High Temperature Operating Life (HTOL)
- High Temperature Humidity (TH)
- High Temperature Humidity Bias test (THB)
- High Temperature Humidity Cycle test (TH Cycle)
- Ion migration test
- Power cycle test (PWC)
- Intermittent Operating Life test (IOL)
- Temperature Cycling test (TC)
- Power Temperature Cycling test (PTC)
- Bonding Level Reliability test (BLR)
- Liquid cooling Thermal Shock test (TS)
- High Accelerated Stress Test (HAST)
- Unbiased Highly Accelerated Stress Test (uHAST)
- Resistance to soldering heat test (MS-Level)
- ESD test(MM・HBM)
- ESD test(CDM)
- ESD test(Latch-up)
High Temperature Storage test (HTSL)／High Temperature Operating Life (HTOL)
-
ESPEC
PH-202(M),PHH-200 etc.
Room temperature +20～300℃
600x600x600mm
High Temperature Humidity (TH)／High Temperature Humidity Bias test (THB)／High Temperature Humidity Cycle test (TH Cycle)／
Ion migration test
-
ESPEC
PSL-4J,PL-4J etc.
-70～100℃ 20～98%RH
1000x800x1000mm 
Power cycle test (PWC)／Intermittent Operating Life test (IOL)
DENKEN
Applied current：10A～500A
Cooling temperature:-10℃～80℃
Test cycle number：1～1-millionCYC
Temperature Cycling test (TC)／Power Temperature Cycling test (PTC)／Bonding Level Reliability test (BLR)
-
ESPEC
TSA-(203,201,71)ES-W,TCC-150W etc.
70～0℃,+60～+200℃
650x670x460mm 
Liquid cooling Thermal Shock test (TS)
-
ESPEC
TSB-51
65～0℃,+70～+200℃
150x200x150mm 
High Accelerated Stress Test (HAST)／Unbiased Highly Accelerated Stress Test (uHAST)
ESPEC
TPC-411D,EHS-221MD etc.
105～142.9℃,75～100%rh
29.5φx300mm
Resistance to soldering heat test (MS-Level)
-
TAMURA
TNR15-225LH 
ESD test(MM・HBM）
-
Hanwa Electronic Ind
HED-S5256A
Leak current measurement function available
Max applied voltage ±8000V 
ESD test(CDM)
Hanwa Electronic Ind
HED-C5002
Humidity control function available
Max applied voltage ±4000V
ESD test(Latch-up))
Hanwa Electronic Ind
HLT-1024LT
High temperature test available
1024-terminal,7-voltage Max100V
