GX
                                          
                  EL tester
 
Micro-crack inspection system for crystalline solar cell modules
EL tester (EL tester for crystalline solar cell modules)
- Features
- 
CMOS camera with sensitivity to near-infrared and complete light shielding for clear image acquisition 
 Fully automatic pitch conversion of the module transfer section
 Display the entire module on a large 32-inch screen
 High speed tact time and suitable pass line for in-line use
 Available to save images and defective area data
 Possible to measure cell size and detect misalignment  
- Main specifications
- 
Target workpiece Crystalline solar cell module 
 950mm x 1250mm to 1910mm x 2000mmMachine tact 40 seconds (Excluding inspection judgment time) Software functions Operation mode: Viewer mode, Setting mode and History mode 
 Inspection function: Micro-crack, String, Bus bar solder failure and String misalignmentOptional Dark IV test function Power supply AC200V 50/60Hz Dimensions 2702(W)×2002(D)×1120(H)mm Specifications are subject to change without notice. 

