Until now, majority of noise evaluations are for assembled and board level EMC test. Recently semiconductor device level evaluation is getting required. More and more automotive manufactures start to adopt this trend for replacement semiconductor parts or competitive products comparison evaluation ( performance equivalence test etc.)

DENKEN has performance achievements of the following standards:

• IEC 62132-4（conducted immunity evaluation：DPI method）
• IEC 61967-4（conduction emissions evaluation：150Ω method）
• JASO D019：automotive semiconductor EMC performance equivalence test method