Reliability/products qualification test line-up
- High Temperature Storage test (HTSL)
- High Temperature Operating Life (HTOL)
- High Temperature Humidity (TH)
- High Temperature Humidity Bias test (THB)
- High Temperature Humidity Cycle test (TH Cycle)
- Ion migration test
- Power cycle test (PWC)
- Intermittent Operating Life test (IOL)
- Temperature Cycling test (TC)
- Power Temperature Cycling test (PTC)
- Bonding Level Reliability test (BLR)
- Liquid cooling Thermal Shock test (TS)
- High Accelerated Stress Test (HAST)
- Unbiased Highly Accelerated Stress Test (uHAST)
- Resistance to soldering heat test (MS-Level)
- ESD test(MM・HBM)
- ESD test(CDM)
- ESD test(Latch-up)
High Temperature Storage test (HTSL)/High Temperature Operating Life (HTOL)
-
ESPEC
PH-202(M),PHH-200 etc.
Room temperature +20~300℃
600x600x600mm
High Temperature Humidity (TH)/High Temperature Humidity Bias test (THB)/High Temperature Humidity Cycle test (TH Cycle)/
Ion migration test
-
ESPEC
PSL-4J,PL-4J etc.
-70~100℃ 20~98%RH
1000x800x1000mm
Power cycle test (PWC)/Intermittent Operating Life test (IOL)
DENKEN
Applied current:10A~500A
Cooling temperature:-10℃~80℃
Test cycle number:1~1-millionCYC
Temperature Cycling test (TC)/Power Temperature Cycling test (PTC)/Bonding Level Reliability test (BLR)
-
ESPEC
TSA-(203,201,71)ES-W,TCC-150W etc.
70~0℃,+60~+200℃
650x670x460mm
Liquid cooling Thermal Shock test (TS)
-
ESPEC
TSB-51
65~0℃,+70~+200℃
150x200x150mm
High Accelerated Stress Test (HAST)/Unbiased Highly Accelerated Stress Test (uHAST)
ESPEC
TPC-411D,EHS-221MD etc.
105~142.9℃,75~100%rh
29.5φx300mm
Resistance to soldering heat test (MS-Level)
-
TAMURA
TNR15-225LH
ESD test(MM・HBM)
-
Hanwa Electronic Ind
HED-S5256A
Leak current measurement function available
Max applied voltage ±8000V
ESD test(CDM)
Hanwa Electronic Ind
HED-C5002
Humidity control function available
Max applied voltage ±4000V
ESD test(Latch-up))
Hanwa Electronic Ind
HLT-1024LT
High temperature test available
1024-terminal,7-voltage Max100V