GX
EL tester

Micro-crack inspection system for crystalline solar cell modules
EL tester (EL tester for crystalline solar cell modules)
- Features
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CMOS camera with sensitivity to near-infrared and complete light shielding for clear image acquisition
Fully automatic pitch conversion of the module transfer section
Display the entire module on a large 32-inch screen
High speed tact time and suitable pass line for in-line use
Available to save images and defective area data
Possible to measure cell size and detect misalignment
- Main specifications
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Target workpiece Crystalline solar cell module
950mm x 1250mm to 1910mm x 2000mmMachine tact 40 seconds (Excluding inspection judgment time) Software functions Operation mode: Viewer mode, Setting mode and History mode
Inspection function: Micro-crack, String, Bus bar solder failure and String misalignmentOptional Dark IV test function Power supply AC200V 50/60Hz Dimensions 2702(W)×2002(D)×1120(H)mm Specifications are subject to change without notice.